Star Tech Instruments has just released our newest products for measuring energy and beam images/profiles in the X-ray, XUV, EUV wavelengths from 1 - 410 nm.
STI now offers Instruments with NIST traceability from 5 nm to 410 nm and measurement capability down to 1 nm.
Energy Probes for X-ray(1 nm to 200 nm)
- NIST Traceable (5nm to 200 nm)
- High Transmission
- No Microphonics
- Low Noise
- Minimal Long-term Drift
- Polarization Insensitive
- High Damage Threshold to 500 mJ/cm2
- Full Range of Input Apertures
- Wide Wavelength Range 1 nm to 200 nm*
- Extremely Linear
- Wide Field of View
- Wide Field input apertures
Energy measurement in the XUV and X-ray normally require a vacuum and STI provides systems with vacuum ratings to 10-10 Torr. We offer multiple aperture options to 38 mm standard and larger if requested.