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    • New Ir2200 System(5)

    Seiwa Optical America's IR-2200 microscope system provides high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.  New features include full automation combined with motorized Z focus and automated X and Y stage. These new features allow you to take stitching images with different extended exposure, field, and focus. Also, this new system allows you to take topography imaging for 3D views and measurements.  

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